Testing of semicondcutor materials andchips

The course deals with basic knowledge and understanding of the testing and evalution procedures needed for semiconductor materials and chip testing. It consists of Introduction, terms and definitions
Why test at all – revenue, cost of testing, quality and reliability
System on a chip development process – milestones, process steps, maturity stages, product life cycle testing, risk assessment
Design for testability – economics and costs, defect and failure models, design techniques, scan design, boundary scan, ATPG, BIST, IDDQ test, memory test
DSP based test development, test hardware and program development
Manufacturing testing such as IC Backend production flow, test hall infrastructure, wafer testing and final testing, multi-site testing.